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ACM – Centering Measurement Device for Aspheres
Highly precise measurement of single- and double-sided aspheresThe ACM (Asphere Centering Measurement Device) is a powerful system for precisely determining centering errors and surface data on aspheric optical components. It combines high-resolution measurement technology with an additional rotational axis and is ideal for development and manufacturing environments with the highest demands.
Absolute World First with V-SPOT Technology
Measure multidimensionally – detect secondary errorsWith V-SPOT technology and redundant acquisition of meridional and sagittal data, even the smallest asphere errors become visible. Secondary defects, such as "kinks in the optics," can be reliably diagnosed.
Multi SPOT for Parallel Surface Measurement
Analyze aspheres faster and more completelySimultaneous acquisition of multiple meridians significantly reduces measurement time and provides precise information about the optical and mechanical axis of the asphere – without the need to remount the lens.
High Accuracy in Manufacturing Environments
Extremely precise – even for small radii and lensesThe ACM is especially suitable for high-precision measurements on small lenses with tight tolerances. The optional air bearing system enables sub-micron centering and sub-arcsecond wobble accuracy.
Intuitive Operation with ELWISOFT Touch Software
4 measurement processes for maximum flexibilityThe modular ELWISOFT software includes specialized applications for aspheric geometries – including Fourier-based MSFE analysis.
Software Modules
- 2SS – Two Step Single: single-sided aspheres
- 2SD – Two Step Double: double-sided aspheres
- HRSS – High Resolution Surface Scan: MSFE analysis
ACM Technical Data
| Technical Details | (From – To) |
|---|---|
| Test specimen diameter | 10 mm to 290 mm |
| Test specimen weight | 10 g to 50 kg |
| Resolution / Reproducibility | up to 0.1″ |
| Run accuracy (centering) | < 0.15 µm |
| Angular run tolerance | < 0.3″ |
| Software | ELWISOFT HRSS module |
| Interface | USB 3.0 |
| Scope of delivery | ELWIMAT-VFS sensor, sensor cable, control PC or touch module, software with mapping options |
Why ACM?
- Highest accuracy: Ideal for double-sided aspheres and small optics
- Advanced: Fourier analysis for process optimization
- Versatile: For prototypes, series production, and research
- Modular: Expandable with air bearings, mapping, inline measurement technology
Request or Order Now
For personal advice or more information about the ACM, we are always available. Simply contact us via our contact form or call us.
